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smartd spamming about Prefailure Attribute: 1

From: "Andrew Farris" <lordmorgul gmail com>
To: "For testers of Fedora Core development releases" <fedora-test-list redhat com>
Subject: smartd spamming about Prefailure Attribute: 1
Date: Wed, 5 Mar 2008 13:54:46 -0800

Hey all,
Attached is a bunch of messages I'm receiving from smartd about
prefailure attribute and usage
attribute for both of my internal drives.  I'm wondering if these
drives are both dying, or if smartd
is misbehaving.  I'm not really familiar with smart, so any clues
would be helpful.
Anyone else seeing excessive messages out of smartd?

rawhide
kernel-2.6.25-0.82.rc3.git2.fc9.i686
smartmontools-5.37-8.5.fc9.i386

-- 
Andrew Farris <lordmorgul gmail com> www.lordmorgul.net
 gpg 0xC99B1DF3 fingerprint CDEC 6FAD BA27 40DF 707E A2E0 F0F6 E622 C99B 1DF3
No one now has, and no one will ever again get, the big picture. - Daniel Geer
----
                                                    ----

> grep SMART /var/log/messages
Mar  4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device
Mar  4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device
Mar  4 01:47:44 cirithungol smartd[2825]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar  4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar  4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable.
Mar  4 02:27:14 cirithungol smartd[2415]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar  4 02:27:14 cirithungol smartd[2415]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar  4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar  4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar  4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 03:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 03:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar  4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar  4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 66
Mar  4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 66
Mar  4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 76
Mar  4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 76
Mar  4 05:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 76 to 73
Mar  4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 76 to 73
Mar  4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar  4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar  4 08:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar  4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar  4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar  4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41
Mar  4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar  4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar  4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar  4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73
Mar  4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42
Mar  4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73
Mar  4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41
Mar  4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 13:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41
Mar  4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 14:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40
Mar  4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42
Mar  4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar  4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41
Mar  4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar  4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74
Mar  4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74
Mar  4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 39
Mar  4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 16:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 38
Mar  4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 37
Mar  4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 17:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 37
Mar  4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 17:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 36
Mar  4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 39
Mar  4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 18:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 36 to 38
Mar  4 18:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar  4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39
Mar  4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar  4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar  4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar  4 19:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74
Mar  4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74
Mar  4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72
Mar  4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72
Mar  4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device
Mar  4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device
Mar  4 20:51:28 cirithungol smartd[2838]: Device: /dev/sda, is SMART capable. Adding to "monitor" list.
Mar  4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list.
Mar  4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable.
Mar  4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40
Mar  4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67
Mar  5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67
Mar  5 01:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar  5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar  5 02:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72
Mar  5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72
Mar  5 03:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 73
Mar  5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 73
Mar  5 03:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 72
Mar  5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 72
Mar  5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67
Mar  5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67
Mar  5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 74
Mar  5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 74
Mar  5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68
Mar  5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68
Mar  5 05:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 05:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 38
Mar  5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67
Mar  5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67
Mar  5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73
Mar  5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73
Mar  5 08:21:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 08:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39
Mar  5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74
Mar  5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74
Mar  5 09:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 09:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39
Mar  5 10:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40
Mar  5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66
Mar  5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66
Mar  5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75
Mar  5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75
Mar  5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73
Mar  5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73


> smartctl --all /dev/sda
smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda ATA IV family
Device Model:     ST340016A
Serial Number:    3HS5967V
Firmware Version: 3.75
User Capacity:    40,020,664,320 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   5
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Wed Mar  5 13:52:26 2008 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 ( 421) seconds.
Offline data collection
capabilities: 			 (0x1b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  31) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   073   061   034    Pre-fail  Always       -       178337265
  3 Spin_Up_Time            0x0003   092   087   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       103
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   078   060   030    Pre-fail  Always       -       66563212
  9 Power_On_Hours          0x0032   065   065   000    Old_age   Always       -       31486
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   099   099   020    Old_age   Always       -       1979
194 Temperature_Celsius     0x0022   041   051   000    Old_age   Always       -       41
195 Hardware_ECC_Recovered  0x001a   073   061   000    Old_age   Always       -       178337265
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age   Offline      -       0
202 TA_Increase_Count       0x0032   100   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%     31486         -
# 2  Short captive       Completed without error       00%      9407         -
# 3  Extended offline    Aborted by host               50%         0         -

Device does not support Selective Self Tests/Logging


> smartctl --all /dev/sdb
smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda ATA IV family
Device Model:     ST340016A
Serial Number:    3HS54X56
Firmware Version: 3.75
User Capacity:    40,020,664,320 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   5
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Wed Mar  5 13:52:31 2008 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 ( 421) seconds.
Offline data collection
capabilities: 			 (0x1b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  31) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   066   060   034    Pre-fail  Always       -       154613141
  3 Spin_Up_Time            0x0003   091   087   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       885
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   088   060   030    Pre-fail  Always       -       673763033
  9 Power_On_Hours          0x0032   065   065   000    Old_age   Always       -       30914
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   099   099   020    Old_age   Always       -       1977
194 Temperature_Celsius     0x0022   040   049   000    Old_age   Always       -       40
195 Hardware_ECC_Recovered  0x001a   066   060   000    Old_age   Always       -       154613141
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age   Offline      -       0
202 TA_Increase_Count       0x0032   100   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short captive       Completed without error       00%      9363         -
# 2  Extended offline    Aborted by host               30%         0         -

Device does not support Selective Self Tests/Logging

Follow-Ups:
- Re: smartd spamming about Prefailure Attribute: 1
  - From: Johann B. Gudmundsson

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